DocumentCode :
1413502
Title :
A neural-learning-based reflectance model for 3-D shape reconstruction
Author :
Cho, Siu-Yeung ; Chow, Tommy W S
Author_Institution :
Dept. of Electron. Eng., City Univ. of Hong Kong, Kowloon, China
Volume :
47
Issue :
6
fYear :
2000
fDate :
12/1/2000 12:00:00 AM
Firstpage :
1346
Lastpage :
1350
Abstract :
In this letter, the limitation of the conventional Lambertian reflectance model is addressed and a new neural-based reflectance model is proposed of which the physical parameters of the reflectivity under different lighting conditions are interpreted by the neural network behavior of the nonlinear input-output mapping. The idea of this method is to optimize a proper reflectance model by a neural learning algorithm and to recover the object surface by a simple shape-from-shading (SFS) variational method with this neural-based model. A unified computational scheme is proposed to yield the best SFS solution. This SFS technique has become more robust for most objects, even when the lighting conditions are uncertain.
Keywords :
image reconstruction; learning (artificial intelligence); light reflection; neural nets; reflectivity; 3-D shape reconstruction; Lambertian reflectance model limitation; lighting conditions; neural-learning-based reflectance model; nonlinear input-output mapping; object surface recovery; reflectivity; shape-from-shading variational method; unified computational scheme; Computer vision; Image reconstruction; Light sources; Manufacturing industries; Neural networks; Optimization methods; Reflectivity; Robustness; Shape; Surface reconstruction;
fLanguage :
English
Journal_Title :
Industrial Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0046
Type :
jour
DOI :
10.1109/41.887964
Filename :
887964
Link To Document :
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