DocumentCode
1413779
Title
Effects of thin Cr interlayer on time decay of magnetization and magnetization reversal for CoCrTaPt thin film media
Author
Wang, Jian-Ping ; Tan, Lea Peng ; Liew, Thomas Y F ; Teng, Edward ; Wang, Po Wen
Author_Institution
Data Storage Inst., Nat. Univ. of Singapore, Singapore
Volume
34
Issue
4
fYear
1998
fDate
7/1/1998 12:00:00 AM
Firstpage
1537
Lastpage
1539
Abstract
The effect of thin Cr interlayer on the time decay of magnetization and magnetization reversal for CoCrTaPt/Cr/CoCrTaPt media is presented. The time decay of magnetization was measured at various reverse magnetic fields. The maximum magnetic viscosity coefficient which occurs around the remanent coercivity increases with increasing interlayer thickness, which implies the degradation of thermal stability. The activation volume decreases with increasing Cr interlayer thickness. Both torque magnetometer and the law of approach to saturation methods were used to measure the magnetic anisotropy. The results show a decrease in anisotropy with increasing interlayer thickness which may explain the degradation of thermal stability. The distribution of rotational hysteresis losses (Wr) were measured and the rotational hysteresis integral (Rh) was found to decrease with increasing Cr interlayer thickness which may be caused by reduction of the magnetic interaction
Keywords
chromium alloys; cobalt alloys; magnetic anisotropy; magnetic recording; magnetic thin films; magnetisation reversal; platinum alloys; remanence; tantalum alloys; CoCrTaPt thin film; CoCrTaPt-Cr; activation volume; anisotropy; magnetization; magnetization reversal; maximum magnetic viscosity coefficient; remanent coercivity; rotational hysteresis losses; thermal stability; thin Cr interlayer; time decay; Chromium; Magnetic anisotropy; Magnetic field measurement; Magnetic hysteresis; Magnetization reversal; Perpendicular magnetic anisotropy; Saturation magnetization; Thermal degradation; Thermal stability; Time measurement;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.706607
Filename
706607
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