Coercivity and frequency dependence of track widths and erase bands in thin film media

Author

Mei, L. ; Schabes, M.E. ; Yeh, N.H.

Author_Institution

Komag Inc., San Jose, CA, USA

Volume

34

Issue

4

fYear

1998

fDate

7/1/1998 12:00:00 AM

Firstpage

1546

Lastpage

1548

Abstract

To understand the data track width, erase bands and the total write width as a function of coercivity and frequency in thin film media, a systematic study was conducted based on triple track profile (TPF) technique using pseudo random sequences (PRS TPF). Frequency harmonics of PRS up to 200 kfci were analyzed to reveal the frequency dependence of the track edge effects. Thin film disks used in this study have coercivities from 1766 Oe to 2878 Oe. Single frequency recording (SF TPF) and MFM (magnetic force microscopy) were utilized for comparison. Regardless of the nonlinear track edge effects, PRS TPF and SF TPF show good correlation over a wide coercivity and frequency range

Keywords

coercive force; magnetic disc storage; magnetic force microscopy; magnetic recording; magnetic thin film devices; PRS TPF; SF TPF; coercivity; data track width; erase band; frequency dependence; frequency harmonic; magnetic force microscopy; magnetic recording medium; nonlinear track edge effect; pseudo random sequence; single frequency recording; thin film disk; total write width; triple track profile; Coercive force; Disk recording; Frequency dependence; Harmonic analysis; Magnetic analysis; Magnetic films; Magnetic force microscopy; Random media; Random sequences; Transistors;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.706610

Filename

706610