Title :
The effect of carbon overcoat diffusion on CoCrTa/Cr thin-film media
Author :
Chang, Jack J.K. ; Johnson, Kenneth E. ; Kawayoshi, Harry ; Ling, Peiching ; Strathman, Michael
Author_Institution :
MaxMedia, Hyundai Electron. America, San Jose, CA, USA
fDate :
7/1/1998 12:00:00 AM
Abstract :
The effect of carbon and chromium diffusion on CoCrTa thin-film media was studied. RBS (Rutherford backscattering) data and TEM (transmission electron microscopy) micrographs indicate that the CoCr 14Ta6 film has a higher film density than the CoCr 14Ta4 film. SIMS (secondary ion mass spectroscopy) data shows that Ta enhances the carbon diffusion into the magnetic layer and that Cr diffusion is not detectable in our process temperature range. The Ms (saturation magnetization) of the two alloys decreases as the magnetic thickness decreases, which may be due to the low film density of the magnetic layer and carbon diffusion into the magnetic layer. Carbon diffusion from the overcoat will play an important role in the performance of future low thickness MR media
Keywords :
Rutherford backscattering; carbon; chemical interdiffusion; chromium alloys; cobalt alloys; ferromagnetic materials; magnetic recording noise; magnetic thin films; magnetisation; secondary ion mass spectra; sputtered coatings; tantalum alloys; transmission electron microscopy; CoCr14Ta4; CoCr14Ta6; CoCrTa-C; CoCrTa-Cr; CoCrTa/Cr thin-film media; Rutherford backscattering; carbon overcoat diffusion; chromium diffusion; composition profile; decoupling of magnetic grains; low thickness media; magnetic properties; magnetic thickness; media noise reduction; microstructure; recording performance; saturation magnetization; secondary ion mass spectroscopy; transmission electron microscopy; Chromium; Magnetic analysis; Magnetic films; Magnetic properties; Magnetic recording; Saturation magnetization; Sputtering; Substrates; Temperature; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on
