Effects of ultra-high vacuum on crystallographic, recording and magnetic properties of thin film media

Author

Gao, C. ; Wu, S. ; Chen, J.-P. ; Malmhall, R. ; Habermeier, C. ; Sinclair, R. ; Laidler, H. ; O´Grady, K.

Author_Institution

Seagate Recording Media, Fremont, CA, USA

Volume

34

Issue

4

fYear

1998

fDate

7/1/1998 12:00:00 AM

Firstpage

1576

Lastpage

1578

Abstract

A range of CoCrPt thin film discs sputtered on CrV underlayers have been prepared under varying base pressures. A general improvement in H_c, squareness S* and recording performance determined by the media SNR was seen when the base pressure was reduced. Electron diffraction studies have clearly shown that a significant proportion of fcc grains are induced when a high base pressure is allowed to remain in the chamber and this is consistent with the presence of residual nitrogen gas in the system

Keywords

chromium alloys; cobalt alloys; coercive force; electron diffraction; ferromagnetic materials; grain size; magnetic hysteresis; magnetic recording noise; magnetic thin films; platinum alloys; remanence; sputter deposition; sputtered coatings; stacking faults; transmission electron microscopy; CoCrPt; CoCrPt thin film discs; CrV; CrV underlayers; HRTEM images; coercive field; crystallographic properties; electron diffraction; induced FCC grains; intergranular interactions; isothermal remanence; magnetic properties; media SNR; recording properties; residual nitrogen gas; sputtered; squareness; stacking faults; thin film magnetic recording media; ultraclean sputtering; ultrahigh vacuum effects; varying base pressures; Anisotropic magnetoresistance; Coercive force; Crystallography; Magnetic anisotropy; Magnetic films; Magnetic properties; Magnetic recording; Nitrogen; Perpendicular magnetic recording; Sputtering;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.706620

Filename

706620