Orientation ratio reduction through pre-deposition substrate annealing

Author

Wong, Bunsen Y. ; Ying, JiFeng ; Tran, Ho

Author_Institution

MaxMedia, Hyundai Electron. America, San Jose, CA, USA

Volume

34

Issue

4

fYear

1998

fDate

7/1/1998 12:00:00 AM

Firstpage

1585

Lastpage

1587

Abstract

The orientation ratio (OR) of magnetic hard disks was modified through pre-deposition substrate annealing. This heat treatment leads to a modulation of the NiP surface chemistry which brought about a different CoCrTa film texture. Our studies verified the essential factors to obtaining OR>1, namely a non-oxidized NiP surface which established a (112¯0) CoCrTa film texture, substrate heating, and mechanical texturing. Parametric tests showed that disks with near unity OR have worse signal-to-noise ratio but possess better off track capability when tested under squeezed conditions

Keywords

X-ray photoelectron spectra; annealing; atomic force microscopy; chromium alloys; cobalt alloys; coercive force; ferromagnetic materials; hard discs; magnetic recording noise; magnetic thin films; magnetisation reversal; nickel alloys; phosphorus alloys; sputter deposition; sputtered coatings; substrates; surface texture; surface topography; tantalum alloys; (112¯0) texture; AFM; CoCrTa; CoCrTa film texture; NiP; NiP surface chemistry; XPS; coercivity; heat treatment; magnetic hard disks; mechanical texturing; modulation; orientation ratio reduction; parametric tests; pre-deposition substrate annealing; recording performance; roughness; signal-to-noise ratio; squeezed conditions; substrate heating; thin film disks; track capability; Annealing; Chemistry; Hard disks; Heat treatment; Heating; Magnetic films; Substrates; Surface texture; Surface treatment; Testing;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.706623

Filename

706623