Thermal stability of ultra-thin Co recording media

Author

Gong, Heng ; Yang, Wei ; Lambeth, David N. ; Rao, Maithri ; Laughlin, David E.

Author_Institution

Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA

Volume

34

Issue

4

fYear

1998

fDate

7/1/1998 12:00:00 AM

Firstpage

1612

Lastpage

1614

Abstract

Ultra-thin Co/Cr films were fabricated by RF diode sputtering. The highly exchange coupled Co grains were successfully isolated by post deposition processing. The microstructure was studied with TEM and a very small physical grain size was observed. The measurement of ΔM curves showed that the grain to grain interaction changed from positive to negative. Time dependent magnetic measurements showed significant thermal decay effects. It was also found that the use of CrMn underlayers instead of pure Cr further isolated the Co grains

Keywords

cobalt; crystal microstructure; exchange interactions (electron); grain size; magnetic recording; magnetic thin films; sputtered coatings; thermal stability; transmission electron microscopy; Co; TEM; grain interaction; grain size; highly exchange coupled Co grains; microstructure; post deposition processing; thermal decay effects; thermal stability; ultra-thin Co recording media; Chromium; Diodes; Magnetic films; Magnetic recording; Micromagnetics; Microstructure; Radio frequency; Sputtering; Testing; Thermal stability;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.706632

Filename

706632