• DocumentCode
    1414372
  • Title

    Environment Exposure Tests of Electron-Emitting Film for Spacecraft Charging Mitigation

  • Author

    Khan, Arifur R. ; Sumida, Takahiro ; Iwata, Minoru ; Toyoda, Kazuhiro ; Cho, Mengu ; Fujita, Tatsuhito

  • Author_Institution
    Lab. of Spacecraft Environ. Interaction Eng., Kyushu Inst. of Technol., Kitakyushu, Japan
  • Volume
    40
  • Issue
    2
  • fYear
    2012
  • Firstpage
    380
  • Lastpage
    387
  • Abstract
    A new electron-emitting device operating in completely passive manner has been developed to prevent spacecraft charging and discharging. It is named as electron-emitting film (ELF) for spacecraft charging mitigation. This emitter (ELF) utilizes the field enhancement at the triple junction formed at the interface where metal and insulator are met and exposed to vacuum. ELF emits prebreakdown emission current that might lead to arcing at the triple junction. Hence, it balances the input and output currents to the spacecraft during substorm. After ensuring the robustness of this ELF against ground handling and in-orbit contamination, laboratory experiment confirmed continuous electron emission for 100 accumulated hours to assure the endurance. In this paper, its durability against high-energy electron and proton irradiation equivalent to ten solar years in GEO is reported. Effect of heat cycling (-150 °C-100 °C) and vacuum ultraviolet irradiation in GEO on this emitter is also completed. Postemissions of this ELF confirm the durability under those harsh space environments.
  • Keywords
    electron emission; space vehicles; surface charging; durability; electron emission; electron-emitting device; electron-emitting film; environment exposure tests; high-energy electron irradiation; proton irradiation; spacecraft charging mitigation; vacuum ultraviolet irradiation; Discharges; Electric potential; Geophysical measurement techniques; Ground penetrating radar; Junctions; Radiation effects; Space vehicles; Electron beam; electron emission; thin-film device; ultraviolet radiation effect;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2011.2179565
  • Filename
    6122065