• DocumentCode
    141443
  • Title

    Detecting melanoma in dermoscopy images using scale adaptive local binary patterns

  • Author

    Riaz, Farhan ; Hassan, Asif ; Javed, M. Younus ; Tavares Coimbra, Miguel

  • Author_Institution
    Dept. of Comput. Eng., Nat. Univ. of Sci. & Technol., Islamabad, Pakistan
  • fYear
    2014
  • fDate
    26-30 Aug. 2014
  • Firstpage
    6758
  • Lastpage
    6761
  • Abstract
    Recent advances in the area of computer vision has led to the development of various assisted diagnostics systems for the detection of melanoma in the patients. Texture and color are considered as two fundamental visual characteristics which are vital for the detection of melanoma. This paper proposes the use of a combination of texture and color features for the classification of dermoscopy images. The texture features consist of a variation of local binary pattern (LBP) in which the strength of the LBPs is used to extract scale adaptive patterns at each pixel, followed by the construction of a histogram. For color feature extraction, we used standard HSV histograms. The extracted features are concatenated to form a feature vector for an image, followed by classification using support vector machines. Experiments show that the proposed feature set exhibits good classification performance comparing favorably to other state-of-the-art alternatives.
  • Keywords
    biomedical optical imaging; cancer; computer vision; feature extraction; image classification; image colour analysis; medical image processing; skin; support vector machines; LBP; color feature extraction; dermoscopy images; image classification; melanoma; scale adaptive local binary patterns; standard HSV histograms; support vector machines; texture features; Feature extraction; Histograms; Image color analysis; Lesions; Malignant tumors; Support vector machines; Visualization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2014 36th Annual International Conference of the IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/EMBC.2014.6945179
  • Filename
    6945179