• DocumentCode
    1414753
  • Title

    Evaluation on Protective Single Event Burnout Test Method for Power DMOSFETs

  • Author

    Liu, Sandra ; Marec, Ronan ; Sherman, Phillip ; Titus, Jeffrey L. ; Bezerra, Francoise ; Ferlet-Cavois, Véronique ; Marin, Marc ; Sukhaseum, Nicolas ; Widmer, Fabien ; Muschitiello, Michele ; Gouyet, Lionel ; Ecoffet, Robert ; Zafrani, Max

  • Author_Institution
    International Rectifier Corp., El Segundo, CA, USA
  • Volume
    59
  • Issue
    4
  • fYear
    2012
  • Firstpage
    1125
  • Lastpage
    1129
  • Abstract
    This paper evaluates protective single event burnout test method on power DMOSFETs to confirm that it provides accurate test results as the destructive test method when performed properly. The selection of resistor values, protective mechanism, and considerations in calculating SEB cross-section are discussed.
  • Keywords
    Power MOSFET; Resistors; Silver; Threshold voltage; Transient analysis; Xenon; Non-destructive; power MOSFET; single event burnout; test method;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2011.2177863
  • Filename
    6122472
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1414753