• DocumentCode
    1414857
  • Title

    Quantized Conductance in \\hbox {Ag/GeS}_{2}/\\hbox {W} Conductive-Bridge Memory Cells

  • Author

    Jameson, John R. ; Gilbert, Nad ; Koushan, Foroozan ; Saenz, Juan ; Wang, Janet ; Hollmer, Shane ; Kozicki, Michael ; Derhacobian, Narbeh

  • Author_Institution
    Adesto Technol. Corp., Sunnyvale, CA, USA
  • Volume
    33
  • Issue
    2
  • fYear
    2012
  • Firstpage
    257
  • Lastpage
    259
  • Abstract
    Ag/GeS2/W conductive-bridge random access memory (CBRAM) cells are shown to program at room temperature to conductance levels near multiples of the fundamental conductance G0 = 2e2/h. This behavior is not accounted for in the traditional view that the conductance of a CBRAM cell is a continuous variable proportional to the maximum current allowed to flow during programming. For on -state resistances on the order of 1/G0 = 12.9 kΩ or less, quantization implies that the Ag “conductive bridge” typically contains a constriction, or even an extended chain, that can be as narrow as a single atom. Implications for device modeling and commercial applications are discussed.
  • Keywords
    electric admittance; random-access storage; CBRAM cell; conductance level; conductive bridge; conductive-bridge random access memory cell; continuous variable proportional; on-state resistance; programming; quantized conductance; Anodes; Cathodes; Histograms; Metals; Programming; Resistance; Wires; Conductive-bridge memory; conductive-bridge random access memory (CBRAM); germanium sulfide; nonvolatile memory; quantized conductance;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2011.2177803
  • Filename
    6122486