• DocumentCode
    1414897
  • Title

    The Technology Demonstration Module On-Board PROBA-II

  • Author

    Harboe-Sørensen, R. ; Poivey, C. ; Fleurinck, N. ; Puimege, K. ; Zadeh, A. ; Guerre, F.-X. ; Lochon, F. ; Kaddour, M. ; Li, L. ; Walter, D. ; Keating, A. ; Jaksic, A. ; Poizat, M.

  • Author_Institution
    RHS Consultant, Voorhout, Netherlands
  • Volume
    58
  • Issue
    3
  • fYear
    2011
  • fDate
    6/1/2011 12:00:00 AM
  • Firstpage
    1001
  • Lastpage
    1007
  • Abstract
    As a semiconductor component radiation effects and technology demonstration experiment, the Technology Demonstration Module (TDM) integrated into the PROBA-II satellite, was launched on November 2nd 2009, into a 800 km polar orbit. This SEU/SEL experiment, in strong support to the Reference SEU Monitor database , will be described and details given about ground testing and calibrations. Since ground testing was carried out on flight lot devices and under flight operational conditions, the in-orbit SEU/SEL database will eventually become a vital reference point for improved modeling, prediction and testing. Evidence to confirm this promise is starting to emerge and will be presented at the end of the paper. As the present in-orbit number of events is still small, only the first month of flight performance will be presented with strong emphasis on validating correct operation of monitored devices.
  • Keywords
    aerospace components; aerospace testing; artificial satellites; calibration; radiation effects; space vehicle electronics; PROBA-II satellite; SEU-SEL experiment; calibration; distance 800 km; ground testing; polar orbit; reference SEU monitor database; semiconductor component radiation effect; technology demonstration experiment; technology demonstration module; Monitoring; Random access memory; Sensitivity; Temperature measurement; Temperature sensors; Testing; Time division multiplexing; Hardness assurance; SEU/SEL; radiation experiment; single event effects; technology demonstration;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2010.2095468
  • Filename
    5677450