Title :
The Technology Demonstration Module On-Board PROBA-II
Author :
Harboe-Sørensen, R. ; Poivey, C. ; Fleurinck, N. ; Puimege, K. ; Zadeh, A. ; Guerre, F.-X. ; Lochon, F. ; Kaddour, M. ; Li, L. ; Walter, D. ; Keating, A. ; Jaksic, A. ; Poizat, M.
Author_Institution :
RHS Consultant, Voorhout, Netherlands
fDate :
6/1/2011 12:00:00 AM
Abstract :
As a semiconductor component radiation effects and technology demonstration experiment, the Technology Demonstration Module (TDM) integrated into the PROBA-II satellite, was launched on November 2nd 2009, into a 800 km polar orbit. This SEU/SEL experiment, in strong support to the Reference SEU Monitor database , will be described and details given about ground testing and calibrations. Since ground testing was carried out on flight lot devices and under flight operational conditions, the in-orbit SEU/SEL database will eventually become a vital reference point for improved modeling, prediction and testing. Evidence to confirm this promise is starting to emerge and will be presented at the end of the paper. As the present in-orbit number of events is still small, only the first month of flight performance will be presented with strong emphasis on validating correct operation of monitored devices.
Keywords :
aerospace components; aerospace testing; artificial satellites; calibration; radiation effects; space vehicle electronics; PROBA-II satellite; SEU-SEL experiment; calibration; distance 800 km; ground testing; polar orbit; reference SEU monitor database; semiconductor component radiation effect; technology demonstration experiment; technology demonstration module; Monitoring; Random access memory; Sensitivity; Temperature measurement; Temperature sensors; Testing; Time division multiplexing; Hardness assurance; SEU/SEL; radiation experiment; single event effects; technology demonstration;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2010.2095468