• DocumentCode
    1415057
  • Title

    Is There a Largest ESD Event?

  • Author

    Bodeau, Michael

  • Author_Institution
    Northrop Grumman Corp., Redondo Beach, CA, USA
  • Volume
    40
  • Issue
    2
  • fYear
    2012
  • Firstpage
    201
  • Lastpage
    208
  • Abstract
    Ground-based electron charging tests are commonly performed as part of satellite design qualification. The objective of the test is to determine the severity of the resulting electrostatic discharges (ESD) and, via subsequent analysis, determine the hazard they pose to the health and function of the satellite. ESD tests generate large data sets because of the substantial and random variation in ESD amplitudes. The variability is readily apparent in time series scatter plots. The average amplitude, the range of amplitudes (standard deviation), and a worst case event in a set of data are immediately seen. If a failure threshold is known, the margin between that threshold and both the average and worst case events can be shown. Common practice is to compare either the worst case observed event or a 3-sigma upper limit to the failure threshold when assessing the risk of ESD-induced failure. Several samples of ESD test data are reviewed, and the cumulative probability distributions are shown to follow a power law relationship. Applying a Gaussian distribution to the data implies failure is nearly impossible, whereas the power law shows failure is certain because the power law has fatter tails in the extreme event end of the distribution. The consequences of fat tails for ESD risk assessment are discussed.
  • Keywords
    Gaussian distribution; aerospace testing; artificial satellites; electrostatic discharge; time series; ESD risk assessment; ESD-induced failure; Gaussian distribution; electrostatic discharges; failure threshold; ground-based electron charging tests; largest ESD event; satellite design qualification; time series scatter plots; Discharges; Earthquakes; Electrostatic discharges; Plasmas; Radio frequency; Surface treatment; Time series analysis; Dielectric breakdown; electron beams; electron radiation effects; electrostatic discharge (ESD); extreme value distributions; failure analysis;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2011.2179674
  • Filename
    6122513