Title :
Modifying functionality of variable optical attenuator to signal monitoring through defect engineering
Author :
Doylend, J.K. ; Knights, Andrew P. ; Luff, B. Jonathan ; Shafiiha, Roshanak ; Asghari, Mehdi ; Gwilliam, R.M.
Author_Institution :
Dept. of Eng. Phys., McMaster Univ., Hamilton, ON, Canada
Abstract :
A commercial silicon-based variable optical attenuator has been converted to a low bandwidth (quasi-CW) light monitor through an ion implantation and annealing process. The measured total optical loss of the device is <5 dB while the responsivity per tapped fraction is 1<mA/W/dB. The straightforward manner in which the monitoring functionality is induced suggests a cost-effective route to CW optical monitors using a widely available commercial product.
Keywords :
annealing; integrated optics; ion implantation; optical attenuators; optical waveguide components; silicon; SiJk; annealing process; continuous wave optical monitor; defect engineering; ion implantation; low bandwidth light monitor; signal monitoring; variable optical attenuator;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2010.2785
