• DocumentCode
    1415112
  • Title

    Modifying functionality of variable optical attenuator to signal monitoring through defect engineering

  • Author

    Doylend, J.K. ; Knights, Andrew P. ; Luff, B. Jonathan ; Shafiiha, Roshanak ; Asghari, Mehdi ; Gwilliam, R.M.

  • Author_Institution
    Dept. of Eng. Phys., McMaster Univ., Hamilton, ON, Canada
  • Volume
    46
  • Issue
    3
  • fYear
    2010
  • Firstpage
    245
  • Lastpage
    246
  • Abstract
    A commercial silicon-based variable optical attenuator has been converted to a low bandwidth (quasi-CW) light monitor through an ion implantation and annealing process. The measured total optical loss of the device is <5 dB while the responsivity per tapped fraction is 1<mA/W/dB. The straightforward manner in which the monitoring functionality is induced suggests a cost-effective route to CW optical monitors using a widely available commercial product.
  • Keywords
    annealing; integrated optics; ion implantation; optical attenuators; optical waveguide components; silicon; SiJk; annealing process; continuous wave optical monitor; defect engineering; ion implantation; low bandwidth light monitor; signal monitoring; variable optical attenuator;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el.2010.2785
  • Filename
    5410674
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1415112