DocumentCode :
1415121
Title :
Charge pump with perfect current matching characteristics in phase-locked loops
Author :
Lee, Jae-shin ; Keel, Min-Sun ; Lim, Shin-II ; Kim, Suki
Author_Institution :
Dept. of Electron. Eng., Korea Univ., Seoul, South Korea
Volume :
36
Issue :
23
fYear :
2000
fDate :
11/9/2000 12:00:00 AM
Firstpage :
1907
Lastpage :
1908
Abstract :
Conventional CMOS charge pump circuits have some current mismatching characteristics. The current mismatch of the charge pump in the PLLs generates a phase offset, which increases spurs in the PLL output signals. In particular, it reduces the locking range in wide range PLLs with a dual loop scheme. A new charge pump circuit with perfect current matching characteristics is proposed. By using an error amplifier and reference current sources, one can achieve a charge pump with good current matching characteristics. It shows nearly perfect current matching characteristics over the whole VCO input range, and the amount of the reference spur is <-75 dBc in the PLL output signal. The charge pump circuit is implemented in a 0.25 μm CMOS process
Keywords :
CMOS analogue integrated circuits; integrated circuit design; phase locked loops; voltage-controlled oscillators; 0.25 micron; CMOS; VCO input range; charge pump; dual loop scheme; error amplifier; locking range; output signal; perfect current matching characteristics; phase offset; phase-locked loops; reference current sources; spurs;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:20001358
Filename :
888639
Link To Document :
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