Direct measurement of the noise appearing in the base circuit of a bipolar transistor

Direct measurements have been made, at 1 kHz, of the noise appearing in the base circuit of a bipolar transistor. These measurements were made to test the validity of a simple approach to the circuit analysis of the noise in bipolar transistors in which the noise-current generator is assumed to be a real generator associated with shot noise on the base current. Results show that the noise-current generator present in the base circuit has a value very close to that predicted by the simple theory.