• DocumentCode
    1415702
  • Title

    SEU Tolerant Latch Based on Error Detection

  • Author

    She, Xiaoxuan ; Li, N. ; Tong, J.

  • Author_Institution
    State Key Lab. of ASIC & Syst., Fudan Univ., Shanghai, China
  • Volume
    59
  • Issue
    1
  • fYear
    2012
  • Firstpage
    211
  • Lastpage
    214
  • Abstract
    This paper presents an SEU hardened latch that can mitigate SEU based on an error detection circuit and a multiplexer. During the hold phase, an SEU on an internal node may upset the logic state of the latch. But the error detection circuit can detect this fault and generate fault indication signals via precharge and discharge operations. The fault indication signals control a multiplexer to select a correct output. Therefore, each latch has some error detection and correction capability.
  • Keywords
    error correction; error detection; fault diagnosis; flip-flops; logic circuits; multiplexing equipment; SEU hardened latch; SEU tolerant latch; discharge operations; error correction; error detection circuit; fault indication signals; logic state; multiplexer; precharge operation; Circuit faults; Clocks; Delay; Latches; Single event upset; Tunneling magnetoresistance; Very large scale integration; Hardened by design; latch; radiation effects; single event upset (SEU);
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2011.2178265
  • Filename
    6123178