DocumentCode :
1415862
Title :
Simultaneous Observation of Lunar Radar Sounder and Laser Altimeter of Kaguya for Lunar Regolith Layer Thickness Estimate
Author :
Kobayashi, Takao ; Kim, Jung Ho ; Lee, Seung Ryeol ; Araki, Hiroshi ; Ono, Takayuki
Author_Institution :
Miner. Resources Res. Div., Korea Inst. of Geosci. & Miner. Resources (KIGAM), Daejeon, South Korea
Volume :
7
Issue :
3
fYear :
2010
fDate :
7/1/2010 12:00:00 AM
Firstpage :
435
Lastpage :
439
Abstract :
Simultaneous observations of Lunar Radar Sounder (LRS) and Laser ALTimeter (LALT) of Kaguya, a Japanese lunar exploration project, were carried out for the purpose of mapping regolith layer thickness of the Moon. Nadir surface echo of a high-frequency (5 MHz) pulse of LRS interferes the shallow (<; 10 m) subsurface echo from the bottom of the regolith layer, which subsequently makes the apparent surface be detected at a range deviated from the actual surface range, while the actual surface range is optically detected by LALT. Regolith layer thickness information is retrieved from this range difference after an inversion process. So far, four major maria on the near side of the Moon (Maria Tranquillitatis, Serenitatis, Imbrium, and Oceanus Procellarum) have been investigated, and the mean regolith layer thicknesses of the four maria were found to be about the same, ranging from 6.3 to 6.9 m. However, spatial distribution of areal regolith thickness appears different in eastern maria from western maria, which implies a difference of the growth history of the regolith layer.
Keywords :
lunar surface; remote sensing by laser beam; Imbrium; Japanese lunar exploration project; Kaguya; Laser ALTimeter; Lunar Radar Sounder interferes; Maria Tranquillitatis; Moon; Oceanus Procellarum; Serenitatis; inversion process; mean regolith layer thicknesses; nadir surface echo; shallow subsurface echo; spatial distribution; Kaguya; Laser ALTimeter (LALT); Lunar Radar Sounder (LRS); regolith;
fLanguage :
English
Journal_Title :
Geoscience and Remote Sensing Letters, IEEE
Publisher :
ieee
ISSN :
1545-598X
Type :
jour
DOI :
10.1109/LGRS.2009.2038499
Filename :
5411790
Link To Document :
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