DocumentCode :
1415886
Title :
(1/3) \\times \\hbox {VDD} -to- (3/2) \\times \\hbox {VDD} Wide-Range I/O Buffer Using 0.35-
Author :
Huang, Chi-Chun ; Lee, Tzung-Je ; Chang, Wei-Chih ; Wang, Chua-Chin
Author_Institution :
Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
Volume :
57
Issue :
2
fYear :
2010
Firstpage :
126
Lastpage :
130
Abstract :
A 0.9/1.2/1.8/2.5/3.3/5.0-V wide-range input/output buffer carried out using a typical complementary metal-oxide-semiconductor (MOS) 2P4M 0.35-μm process is proposed in this brief. An input buffer with a logic calibration circuit is used for receiving a low voltage signal. A novel floating n-well circuit is employed to remove the body effect at the output p-channel MOS (PMOS). Moreover, a dynamic driving detector is included to equalize the turn-on voltages for the output PMOS and n-channel MOS transistors. The worst-case duty cycle of the output signal can then be 54.2% in a low-voltage mode. The maximum output frequency of the proposed design is measured to be 17.9/27.9/35.3/70.1/79.2/60.0 MHz for VDDIO = 0.9/1.2/1.8/2.5/3.3/5.0 V, respectively. The power consumption is 553 nW at the worst simulation case of [SS, 100°C] and 330 nW by on-silicon measurement.
Keywords :
CMOS integrated circuits; MOSFET; buffer circuits; CMOS technology; VDD wide-range I-O buffer; complementary metal-oxide-semiconductor 2P4M process; dynamic driving detector; floating n-well circuit; frequency 17.9 MHz; frequency 27.9 MHz; frequency 35.3 MHz; frequency 60 MHz; frequency 70.1 MHz; frequency 79.2 MHz; logic calibration circuit; n-channel MOS transistors; on-silicon measurement; p-channel MOS transistors; power 330 nW; power 553 nW; size 0.35 mum; temperature 100 °C; turn-on voltages; voltage 0.9 V; voltage 1.2 V; voltage 1.8 V; voltage 2.5 V; voltage 3.3 V; voltage 5 V; Floating n-well; gate tracking; input/output (I/O) buffer; level converter; mixed-voltage tolerant;
fLanguage :
English
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-7747
Type :
jour
DOI :
10.1109/TCSII.2010.2040311
Filename :
5411793
Link To Document :
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