Title :
BiCMOS thermal sensor circuit for built-in test purposes
Author :
Altet, J. ; Rubio, A. ; Dilhaire, S. ; Schaub, E. ; Claeys, W.
Author_Institution :
Dept. of Electron. Eng., Univ. Politecnica de Catalunya, Barcelona, Spain
fDate :
6/25/1998 12:00:00 AM
Abstract :
New difficulties have arisen in integrated circuit (IC) testing due to trends in technological development. Alternatives to traditional circuit testing techniques are appearing, such as thermal testing. The authors present a new built-in IC-surface differential thermal sensor. The sensor, analysis, implementation on a BiCMOS specific integrated circuit, and experimental measurements show the viability of temperature sensing for testing purposes
Keywords :
BiCMOS integrated circuits; built-in self test; integrated circuit testing; temperature sensors; BiCMOS IC; IC testing; IC-surface differential thermal sensor; built-in test purposes; technological development trends; thermal sensor circuit; thermal testing;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19980947
