DocumentCode
1416123
Title
Conference Reports
Volume
28
Issue
6
fYear
2011
Firstpage
94
Lastpage
95
Abstract
This column describes the IEEE 2011 East-West Design & Test International Symposium and the 3D-Test Workshop at the 2011 International Test Conference.
Keywords
3D-Test; EWDTS; design and test;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2011.124
Filename
6123687
Link To Document