DocumentCode
1416128
Title
Hybrid Analysis of Electromagnetic Interference Effects on Microwave Active Circuits Within Cavity Enclosures
Author
Yang, Taesik ; Bayram, Yakup ; Volakis, John L.
Author_Institution
DMC R&D Center, Samsung Electron., Suwon, South Korea
Volume
52
Issue
3
fYear
2010
Firstpage
745
Lastpage
748
Abstract
We present a hybrid analysis technique based on a decomposition approach to evaluate electromagnetic interference (EMI) effects on RF active and passive circuit components enclosed within multilayer cavities exposed to external electromagnetic waves. The adopted decomposition concept separates the analysis of the passive printed circuits and shielding cavity from the nonlinear components. The method of moments with a layered media Green´s function is employed for the passive components and layered printed circuit board. For the nonlinear active devices circuit tools such as HSPICE or Agilent ADS are employed for their analysis. Using this approach, we investigated EMI effects on an enclosed RF power amplifier board with varying slot lengths on the shielding cavities. We found that external EMI could upset active circuits even in the shielded enclosure through a narrow slot aperture for certain frequencies of the interfering source.
Keywords
Green´s function methods; electromagnetic interference; microwave circuits; power amplifiers; printed circuits; radiofrequency amplifiers; Agilent ADS; EMI effects; HSPICE; RF active circuit component; RF passive circuit component; cavity enclosures; electromagnetic interference effects; enclosed RF power amplifier board; external electromagnetic waves; layered media Green´s function; layered printed circuit board; microwave active circuits; multilayer cavities; Active circuits; Electromagnetic analysis; Electromagnetic interference; Electromagnetic scattering; Green´s function methods; Moment methods; Nonhomogeneous media; Passive circuits; Printed circuits; Radio frequency; Cavity enclosures; Green's function; decomposition approach; electromagnetic interference (EMI); method of moment (MoM);
fLanguage
English
Journal_Title
Electromagnetic Compatibility, IEEE Transactions on
Publisher
ieee
ISSN
0018-9375
Type
jour
DOI
10.1109/TEMC.2009.2038993
Filename
5411830
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