• DocumentCode
    1416221
  • Title

    Measurements on millimetre wave circuits at 140 GHz

  • Author

    Boese, I M ; Collier, R.J.

  • Author_Institution
    Electron. Eng. Labs., Kent Univ., Canterbury, UK
  • Volume
    145
  • Issue
    4
  • fYear
    1998
  • fDate
    7/1/1998 12:00:00 AM
  • Firstpage
    171
  • Lastpage
    176
  • Abstract
    The paper describes a novel technique for the measurement of monolithic millimetre wave circuits at 140 GHz. These circuits are measured using a coplanar waveguide probe which is linked via a dielectric waveguide to a multistate reflectometer. This reflectometer is mounted on a probe station, close to the circuit, and is connected via a flexible dielectric guide to an oscillator. The reflectometer is constructed using dielectric waveguide components and operates from 118 to 178 GHz. The paper shows some initial measurements of passive circuit components which are part of a set of coplanar waveguide test circuits on a gallium arsenide substrate at 140 GHz. The paper concludes with a discussion of the results
  • Keywords
    MIMIC; coplanar waveguides; integrated circuit measurement; swept-frequency reflectometry; 118 to 178 GHz; 140 GHz; coplanar waveguide probe; dielectric waveguide; flexible dielectric guide; gallium arsenide substrate; measurement technique; monolithic millimetre wave circuits; multistate reflectometer; offset shorts; on-wafer probe; passive circuit components; sweep generator;
  • fLanguage
    English
  • Journal_Title
    Science, Measurement and Technology, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2344
  • Type

    jour

  • DOI
    10.1049/ip-smt:19982101
  • Filename
    707320