Title :
Surface effects on microwave signals propagating in semiconductors
Author :
Nag, B.R. ; Roy, S.K. ; Das, P.
Author_Institution :
University Collage of Technology, Calcutta, India
fDate :
7/1/1963 12:00:00 AM
Abstract :
The effect of the variation of electrical properties at the surface on the propagation of a microwave signal through a semiconductor placed in a guide are analysed by a perturbation method. General expressions are obtained for the reflection and transmission coefficients of the semiconductor sample. The results of the analysis are discussed with reference to microwave measurement of the bulk and surface properties of semiconductors.
Keywords :
characteristics measurement; electric variables measurement; electromagnetic wave propagation; semiconductors; surface phenomena; waveguides;
Journal_Title :
Electrical Engineers, Proceedings of the Institution of
DOI :
10.1049/piee.1963.0164
