• DocumentCode
    1416456
  • Title

    Three-dimensional numerical semiconductor device simulation: algorithms, architectures, results

  • Author

    Heiser, Gemot ; Pommerell, Claude ; Weis, Jiirgen ; Fichtner, Wolfgang

  • Author_Institution
    Inst. fuer Integrierte Syst., Zurich, Switzerland
  • Volume
    10
  • Issue
    10
  • fYear
    1991
  • fDate
    10/1/1991 12:00:00 AM
  • Firstpage
    1218
  • Lastpage
    1230
  • Abstract
    The authors present SECOND, a program for large-scale semiconductor device simulation with truly three-dimensional grids. Since 3-D simulations necessitate large computing resources, the choice of algorithms and their implementation become of utmost importance. The authors investigated the most commonly used numerical algorithms for the solution of the classical drift-diffusion equations. The study included coupled and noncoupled point and block schemes, direct and preconditioned iterative linear solvers, and several distinct ordering and coloring techniques. Structures with regular and irregular grids were analyzed. These algorithms were compared on a variety of machines including workstations, minisupers, and supercomputers. Results of transient simulations are presented to illustrate the approach
  • Keywords
    digital simulation; electronic engineering computing; iterative methods; parallel algorithms; semiconductor device models; 3D numerical simulation; SECOND; block schemes; coloring techniques; distinct ordering; drift-diffusion equations; irregular grids; numerical algorithms; preconditioned iterative linear solvers; regular grids; semiconductor device simulation; three-dimensional grids; transient simulations; Computational modeling; Computer architecture; Equations; Iterative algorithms; Large-scale systems; Linear systems; Numerical simulation; Semiconductor devices; Tensile stress; Workstations;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.88918
  • Filename
    88918