DocumentCode :
1416530
Title :
Reliability of liquid crystal polymer air cavity packaging
Author :
Aihara, Kunia ; Chen, Morgan Jikang ; Chen, Cheng ; Pham, Anh-Vu H.
Author_Institution :
Air Force Res. Lab., Wright-Patterson AFB, OH, USA
Volume :
2
Issue :
2
fYear :
2012
Firstpage :
224
Lastpage :
230
Abstract :
We present the development of liquid crystal polymer (LCP) packages and thermal compression sealing processes. We demonstrate the complete process for prototyping, sealing, and assembling a single-chip LCP package at microwave frequencies. Using the thermal compression technique, we achieve a measured fine leak rate of 3.7×10-8 cc-atm/s of a LCP package cavity. We have conducted a series of environmental tests such as temperature cycling and 85°C and 85% humidity. We demonstrated that LCP packages have passed major environmental tests and proved to be a reliable package platform.
Keywords :
assembling; chip scale packaging; liquid crystal polymers; reliability; assembling; liquid crystal polymer air cavity packaging; microwave frequencies; reliability; single-chip LCP package; thermal compression sealing; Cavity resonators; Helium; Humidity; Moisture; Reliability; Temperature measurement; Testing; Cavities; liquid crystal polymer; organic; packaging;
fLanguage :
English
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-3950
Type :
jour
DOI :
10.1109/TCPMT.2011.2178092
Filename :
6125236
Link To Document :
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