DocumentCode :
1416533
Title :
DYNAMITE: an efficient automatic test pattern generation system for path delay faults
Author :
Fuchs, Karl ; Fink, Franz ; Schulz, Michael H.
Author_Institution :
Dept. of Electr. Eng., Tech. Univ. of Munich, Germany
Volume :
10
Issue :
10
fYear :
1991
fDate :
10/1/1991 12:00:00 AM
Firstpage :
1323
Lastpage :
1335
Abstract :
The authors present DYNAMITE, a versatile and efficient automatic test pattern generation system for path delay fault. Based upon a ten-valued and a three-valued logic, the deterministic test pattern generation algorithm incorporated in DYNAMITE is capable of generating both robust and nonrobust tests for path delay faults. Particular emphasis has been placed on coping with the main disadvantage of the path delay fault model. The distinct features of DYNAMITE consist of the application of a powerful implication procedure and a stepwise path sensitization procedure, which has the capability of proving large numbers of path faults as redundant by a single test generation attempt. The delay test generation process is further optimized by the use of a new path selection procedure which aims at the identification of paths, which can successfully be sensitized, and the elimination of redundant, i.e., unsensitizable, paths
Keywords :
automatic testing; delays; fault location; logic testing; many-valued logics; ternary logic; DYNAMITE; automatic test pattern generation; deterministic test pattern; implication procedure; nonrobust tests; path delay faults; path selection procedure; robust tests; stepwise path sensitization procedure; ten-valued logic; three-valued logic; Automatic test pattern generation; Circuit faults; Circuit testing; Delay systems; Design automation; Logic testing; Propagation delay; System testing; Test pattern generators; Timing;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.88928
Filename :
88928
Link To Document :
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