• DocumentCode
    1416664
  • Title

    Nonlinear conduction in aromatic polyurea thin films and its influence on dielectric applications over a broad temperature range

  • Author

    Wang, Yong ; Zhou, Xin ; Lin, Minren ; Lu, Sheng-Guo ; Lin, Junhong ; Furman, Eugene ; Zhang, Q.M.

  • Author_Institution
    Electr. Eng. Dept., Pennsylvania State Univ., University Park, PA, USA
  • Volume
    17
  • Issue
    1
  • fYear
    2010
  • fDate
    2/1/2010 12:00:00 AM
  • Firstpage
    28
  • Lastpage
    33
  • Abstract
    We investigate nonlinear conduction in aromatic polyurea thin films and its influence on the dielectric applications over a broad temperature range. The experimental data indicate that several high field conduction mechanisms coexist in the polymer films and one conduction mechanism may dominate over the others depending on different temperatures. The results also reveal that owing to the non-linear increase of the conduction loss with field, the dielectric loss at high field can be many orders of magnitude larger than that at low field. Therefore, besides the electrical breakdown strength, the conduction loss at high field and their temperature dependence behavior are other key factors in developing polymer dielectric materials for high energy density dielectric applications over a broad temperature range.
  • Keywords
    dielectric losses; electric breakdown; electrical conductivity; polymer films; aromatic polyurea thin films; dielectric applications; dielectric loss; electrical breakdown strength; high field conduction; nonlinear conduction; polymer films; Capacitors; Dielectric breakdown; Dielectric constant; Dielectric losses; Dielectric materials; Dielectric thin films; Electric breakdown; Polymers; Temperature dependence; Temperature distribution; Dielectric loss; conduction; dielectric materials; high energy density polymer capacitors;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2010.5411998
  • Filename
    5411998