DocumentCode
1416858
Title
Design of test sequences for VLSI self-testing using LFSR
Author
Hollmann, Henk
Author_Institution
Philips Natuurkundig Lab., Eindhoven, Netherlands
Volume
36
Issue
2
fYear
1990
fDate
3/1/1990 12:00:00 AM
Firstpage
386
Lastpage
392
Abstract
Consider a shift register (SR) of length n and a collection of designated subsets of {0,1, . . ., n -1}. The problem is how to add feedback to the SR such that the resulting linear feedback shift register (LFSR) exercises (almost) exhaustively each of the designated subsets and is of small period. Several previously known results for maximum-length LFSR are extended to more general LFSR, and in particular a previously known algorithm is simplified and extended. Applications to the problems of VLSI self-testing are discussed and illustrated
Keywords
VLSI; automatic testing; binary sequences; integrated circuit testing; shift registers; VLSI; linear feedback shift register; self-testing; test sequences design; Automatic testing; Built-in self-test; Character generation; Costs; Design methodology; Linear feedback shift registers; Polynomials; Shift registers; Strontium; Very large scale integration;
fLanguage
English
Journal_Title
Information Theory, IEEE Transactions on
Publisher
ieee
ISSN
0018-9448
Type
jour
DOI
10.1109/18.52485
Filename
52485
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