• DocumentCode
    1417318
  • Title

    SiGe BiCMOS 3.3-V clock and data recovery circuits for 10-Gb/s serial transmission systems

  • Author

    Meghelli, Mounir ; Parker, Ben ; Ainspan, Herschel ; Soyuer, Mehmet

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • Volume
    35
  • Issue
    12
  • fYear
    2000
  • Firstpage
    1992
  • Lastpage
    1995
  • Abstract
    Two fully monolithic clock and data recovery (CDR) circuits for serial optical fiber links are presented. One CDR is targeting SONET OC-192 application while the other is a possible 10-GigaBit Ethernet application using 8B/10B coded data. The ICs are fabricated in a SiGe BiCMOS technology with a 45-GHz cut-off frequency. The CDRs extract a full rate clock and recover data from a random input bit stream. Each IC integrates a novel self-correcting phase detector, a delay-interpolating ring voltage-controlled oscillator, and a lock-to-reference loop for frequency acquisition. High-speed operation, low time jitter, and large jitter tolerance are the main features of the circuits. Each macro dissipates about 320 mW from 3.3-V supply.
  • Keywords
    BiCMOS integrated circuits; Ge-Si alloys; SONET; optical fibre LAN; optical fibre networks; phase detectors; semiconductor materials; synchronisation; timing jitter; voltage-controlled oscillators; 10 Gbit/s; 3.3 V; 320 mW; 45 GHz; BiCMOS; CDR; Ethernet application; SONET OC-192 application; SiGe; clock and data recovery circuits; cut-off frequency; delay-interpolating ring voltage-controlled oscillator; frequency acquisition; high-speed operation; jitter tolerance; lock-to-reference loop; random input bit stream; self-correcting phase detector; serial optical fiber links; serial transmission systems; time jitter; BiCMOS integrated circuits; Clocks; Cutoff frequency; Data mining; Ethernet networks; Germanium silicon alloys; Jitter; Optical fibers; SONET; Silicon germanium;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.890314
  • Filename
    890314