• DocumentCode
    1417768
  • Title

    Estimating optical flow in segmented images using variable-order parametric models with local deformations

  • Author

    Black, Michael J. ; Jepson, Allan D.

  • Author_Institution
    Xerox Palo Alto Res. Center, CA, USA
  • Volume
    18
  • Issue
    10
  • fYear
    1996
  • fDate
    10/1/1996 12:00:00 AM
  • Firstpage
    972
  • Lastpage
    986
  • Abstract
    This paper presents a new model for estimating optical flow based on the motion of planar regions plus local deformations. The approach exploits brightness information to organize and constrain the interpretation of the motion by using segmented regions of piecewise smooth brightness to hypothesize planar regions in the scene. Parametric flow models are estimated in these regions in a two step process which first computes a coarse fit and then estimates the appropriate parametrization of the motion of the region. The initial fit is refined using a generalization of the standard area-based regression approaches. Since the assumption of planarity is likely to be violated, we allow local deformations from the planar assumption in the same spirit as physically-based approaches which model shape using coarse parametric models plus local deformations. This parametric plus deformation model exploits the strong constraints of parametric approaches while retaining the adaptive nature of regularization approaches. Experimental results on a variety of images model produces accurate flow estimates while the incorporation of brightness segmentation boundaries
  • Keywords
    brightness; computer vision; image segmentation; image sequences; motion estimation; area-based regression; brightness; image segmentation; images model; local deformations; motion estimation; optical flow estimation; parametric flow models; Brightness; Deformable models; Image motion analysis; Image segmentation; Layout; Motion estimation; Nonlinear optics; Parametric statistics; Semiconductor device modeling; Shape;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.541407
  • Filename
    541407