• DocumentCode
    1417799
  • Title

    Grasping SOI floating-body effects

  • Author

    Krishnan, Srinath ; Fossum, Jerry G.

  • Author_Institution
    Technol. Dev. Group, AMD, Sunnyvale, CA, USA
  • Volume
    14
  • Issue
    4
  • fYear
    1998
  • fDate
    7/1/1998 12:00:00 AM
  • Firstpage
    32
  • Lastpage
    37
  • Abstract
    It is important to understand what the floating-body effects are and how they affect device and circuit behavior. In this regard, this article qualitatively explains the device physics underlying DC and transient floating-body effects, clearly implying their influence on circuits, and thereby giving good insight into PD/SOI CMOS design issues. The article also notes special but practical device and circuit designs for controlling floating-body effects, showing through simulation how PD/SOI offers a significant performance advantage over bulk silicon in low-voltage applications, thereby conveying an assurance that reliable SOI CMOS design is feasible
  • Keywords
    CMOS integrated circuits; ULSI; integrated circuit design; silicon-on-insulator; transients; CMOS design; DC effects; SOI floating-body effects; ULSI; device physics; low-voltage applications; transient effects; CMOS process; CMOS technology; Circuit synthesis; Electric breakdown; Fabrication; MOS devices; MOSFETs; Partial discharges; Threshold voltage; Ultra large scale integration;
  • fLanguage
    English
  • Journal_Title
    Circuits and Devices Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    8755-3996
  • Type

    jour

  • DOI
    10.1109/101.708479
  • Filename
    708479