• DocumentCode
    1417822
  • Title

    A new methodology for gray-scale character segmentation and recognition

  • Author

    Lee, Seong-Whan ; Lee, Dong-June ; Park, Hee-Seon

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Korea Univ., Seoul, South Korea
  • Volume
    18
  • Issue
    10
  • fYear
    1996
  • fDate
    10/1/1996 12:00:00 AM
  • Firstpage
    1045
  • Lastpage
    1050
  • Abstract
    Generally speaking, through the binarization of gray-scale images, useful information for the segmentation of touched or overlapped characters may be lost in many cases. If we analyze gray-scale images, however, specific topographic features and the variation of intensities can be observed in the character boundaries. In this paper, we propose a new methodology for character segmentation and recognition which makes the best use of the characteristics of gray-scale images. In the proposed methodology, the character segmentation regions are determined by using projection profiles and topographic features extracted from the gray-scale images. Then a nonlinear character segmentation path in each character segmentation region is found by using multi-stage graph search algorithm. Finally, in order to confirm the nonlinear character segmentation paths and recognition results, a recognition-based segmentation method is adopted. Through the experiments with various kinds of printed documents, it is convinced that the proposed methodology is very effective for the segmentation and recognition of touched and overlapped characters
  • Keywords
    character recognition; feature extraction; graph theory; image representation; image segmentation; search problems; character recognition; character segmentation; gray-scale images; multistage graph search; overlapped characters; topographic features; touched characters; Character recognition; Computer Society; Computer science; Feature extraction; Gray-scale; Image analysis; Image recognition; Image segmentation; Neural networks; Printing;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.541415
  • Filename
    541415