Title :
The relevance of fT and fmax for the speed of a bipolar CE amplifier stage
Author_Institution :
Philips Res. Lab., Eindhoven, Netherlands
fDate :
5/1/1997 12:00:00 AM
Abstract :
Expressions relating the bandwidth of a common-emitter (CE) amplifier stage and the small-signal CML gate delay time to directly measurable transistor parameters, such as fT, fmax, and input bandwidth fυ, are presented. They are valid for an arbitrary division of the base resistance and base-collector depletion capacitance into internal and external components. No resistance measurements are needed. It is shown that the transistor input bandwidth fυ is an important figure of merit for the speed of a CE stage. Under a given bias condition, fυ is determined by the base resistance and the cut-off frequency. In most cases the value of the maximum oscillation frequency fmax is only of minor importance. It would therefore be more meaningful to present besides fT also fυ instead of fmax as a figure of merit for transistors for high-speed, low-power analog and digital circuits
Keywords :
amplifiers; bipolar analogue integrated circuits; circuit analysis computing; current-mode logic; delays; integrated circuit modelling; analogue amplifier; base resistance; base-collector depletion capacitance; bias condition; bipolar common-emitter amplifier stage speed; cutoff frequency; directly measurable transistor parameters; figure of merit; high-speed low-power circuits; input bandwidth; maximum frequency of oscillation; modelling; numerical simulation; small-signal CML gate delay time; Bandwidth; Capacitance measurement; Circuits; Cutoff frequency; Delay effects; Differential amplifiers; Electrical resistance measurement; Particle measurements; Time measurement; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on