Title :
Growth Condition Dependence of Microcracks in YBCO Thin Films Pulsed Laser Deposited on
(001) Substrates
Author :
Palonen, H. ; Huhtinen, H. ; Paturi, P.
Author_Institution :
Dept. of Phys. & Astron., Univ. of Turku, Turku, Finland
Abstract :
The high-temperature superconductor YBCO is typically used as a thin film or coating in applications, but the brittle YBCO layer is often prone to develop small cracks, which reduce its performance. To better understand the crack formation and its connection to the uniaxial twinning state of YBCO on NdGaO3 (001) substrates, a series of YBCO thin films has been grown by pulsed laser deposition with varying deposition temperature and growth rate. The structural properties of the samples are analyzed by atomic force microscopy and X-ray diffraction. The crack formation reduces the critical current densities, which have been measured magnetically. The results show a significant decrease in crack formation with decreased deposition temperature and also with decreased growth rate.
Keywords :
X-ray diffraction; atomic force microscopy; barium compounds; high-temperature superconductors; microcracks; pulsed laser deposition; superconducting thin films; yttrium compounds; AFM; NdGaO3; X-ray diffraction; XRD; YBCO; YBCO thin films; atomic force microscopy; brittle YBCO layer; crack formation; critical current densities; deposition temperature; growth condition dependence; growth rate; high-temperature superconductor; microcracks; pulsed laser deposition; structural properties; uniaxial twinning state; Critical current density (superconductivity); Pulsed laser deposition; Substrates; Superconducting magnets; Temperature; Temperature measurement; Yttrium barium copper oxide; Crack formation; YBCO thin films; crack formation; pulsed laser deposition;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2014.2365407