DocumentCode :
1418378
Title :
An Ultrasonic Transducer Interface IC With Integrated Push-Pull 40 Vpp, 400 mA Current Output, 8-bit DAC and Integrated HV Multiplexer
Author :
Borg, Johan ; Johansson, Jonny
Author_Institution :
Dept. of Comput. Sci. & Electr. Eng., Lulea Univ. of Technol., Lulea, Sweden
Volume :
46
Issue :
2
fYear :
2011
Firstpage :
475
Lastpage :
484
Abstract :
We present an ultrasonic transducer interface IC that includes an 8-bit, 40 Vpp, 400 mA current output DAC for arbitrary waveform transducer excitation and a ±25 V analog multiplexer. The IC was fabricated using a 0.35 μm, 50 V CMOS process. The design eliminates the need for an external power amplifier as the piezoelectric transducer is driven directly from a segmented push-pull current output DAC, which simplifies the overall system design. This approach has the advantage of simple and rapid glitch-free power-up/down, which is especially important in integrated high-output-power drivers. The DAC has been evaluated when operating at a 150 MHz sampling rate with a ±400 mA output current and a 50 Ω load. Measured performance includes 37 dB SNDR and 46 dB SFDR at 10 MHz output frequency. By implementing an additional reference DAC and extending the receiver isolation switch into an analog multiplexer, we enable on-line calibration for the purpose of reducing the driver and receiver signal path uncertainty. Measurements show a greater than ten-fold improvement in delay uncertainty to approximately 20 ps for temperature variations of 0 to 70 degrees Celsius.
Keywords :
digital-analogue conversion; ultrasonic transducers; analog multiplexer; arbitrary waveform transducer excitation; current 400 mA; driver signal path uncertainty; frequency 10 MHz; frequency 150 MHz; integrated HV multiplexer; integrated push-pull; online calibration; piezoelectric transducer; receiver isolation switch; receiver signal path uncertainty; reference DAC; size 0.35 mum; ultrasonic transducer interface IC; voltage 40 V; voltage 50 V; word length 8 bit; Current-output DAC; digital-analog converter; digital-analogue conversion; driver circuits; field effect transistor switches; high voltage level shifter; high-voltage integrated circuits; mixed analogue-digital integrated circuits; on-chip calibration technique; segmented thermometer coded DAC; supply voltage sensitivity; ultrasonic measurement;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2010.2096113
Filename :
5680612
Link To Document :
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