Title :
The Effect of Operating Temperature on Transport AC Loss According to an YBCO Superconducting Tape Array Geometry
Author :
Hwang, Young Jin ; Chang, Ki Sung ; Kim, Young Jae ; Choi, Sukjin ; Kim, Hyung Jun ; Kim, Kyoung-Jun ; Lee, Haigun ; Ko, Tae Kuk
Author_Institution :
Sch. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea
fDate :
6/1/2011 12:00:00 AM
Abstract :
Both AC transport current and magnetic field which are generated by the AC transport current lead to energy loss so called transport AC loss in power equipments using superconducting tapes. The transport AC loss is closely related to stability and efficiency of superconducting power equipments. Therefore, we need to deal with the transport AC loss characteristics of the superconducting tapes under various conditions. In this paper, we investigated temperature dependence of the transport ac loss with respect to the superconducting tape array geometry. The transport AC loss was measured by an electrical method. The experiments were carried out at temperature from 63 K to 77 K . We proved validity of the measurements by a finite element method. Measured data showed that the transport AC loss was influenced by not only superconducting tapes array geometry but the operating temperature. Proposed results in this paper would be utilized to design superconducting power equipments.
Keywords :
barium compounds; finite element analysis; high-temperature superconductors; superconducting devices; superconducting tapes; yttrium compounds; AC transport current; YBCO; YBCO superconducting tape array geometry; electrical method; energy loss; finite element method; magnetic field; operating temperature; superconducting power equipments; temperature 63 K to 77 K; temperature dependence; transport AC loss characteristics; Loss measurement; Substrates; Superconducting coils; Superconducting films; Superconducting magnets; Temperature measurement; AC loss; operating temperature; superconducting tape array geometry;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2010.2096793