Title :
Behavioral Modeling of IC Core Power-Delivery Networks From Measured Data
Author :
Stievano, Igor S. ; Rigazio, Luca ; Maio, Ivan A. ; Canavero, Flavio G.
Author_Institution :
Dipt. di Elettron., Politec. di Torino, Turin, Italy
fDate :
3/1/2011 12:00:00 AM
Abstract :
The modeling of the core power-delivery network of digital integrated circuits (ICs) is addressed by a black-box approach, leading to an n-port equivalent of the IC. The model parameters are estimated from external measurements carried out at the IC ports. The modeling procedure is demonstrated for a commercial NOR Flash Memory in 90 nm technology housed by a specifically-designed test fixture.
Keywords :
NOR circuits; flash memories; integrated circuit modelling; integrated memory circuits; IC port; NOR Flash Memory; black-box approach; core power-delivery network modeling; digital integrated circuit; size 90 nm; test fixture; Admittance; Bonding; Computational modeling; Current measurement; Integrated circuit modeling; Wires; Circuit modeling; digital integrated circuits (ICs); input/output (I/O) ports; macromodeling; power delivery network; power integrity;
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCPMT.2010.2099970
