Title :
Understanding the regenerative comparator circuit
Author :
Abidi, Abdessalem ; Hao Xu
Author_Institution :
Electr. Eng. Dept., Univ. of California, Los Angeles, Los Angeles, CA, USA
Abstract :
The regenerative comparator circuit which lies at the heart of A/D conversion, slicer circuits, and memory sensing, is unstable, time-varying, nonlinear, and with multiple equilibria. That does not mean, as this paper shows, that it cannot be understood with simple equivalent circuits that reveal its dynamics completely, and enable it to be designed to specifications on static and dynamic offset and noise. The analysis is applied to the StrongArm latch.
Keywords :
analogue-digital conversion; comparators (circuits); AD conversion; equivalent circuits; memory sensing; regenerative comparator circuit; slicer circuits; Capacitors; Equivalent circuits; Field effect transistors; Inverters; Latches; Trajectory; Vectors;
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2014 IEEE Proceedings of the
Conference_Location :
San Jose, CA
DOI :
10.1109/CICC.2014.6946003
