DocumentCode :
141860
Title :
A 500nA quiescent current, trim-free, ±1.75% absolute accuracy, CMOS-only voltage reference based on anti-doped N-channel MOSFETs
Author :
Al-Shyoukh, Mohammad ; Kalnitsky, Alex
Author_Institution :
TSMC, Austin, TX, USA
fYear :
2014
fDate :
15-17 Sept. 2014
Firstpage :
1
Lastpage :
4
Abstract :
In this paper, an ultra low power CMOS-only voltage reference is presented. The reference exploits the work function difference between anti-doped (flipped-gate) and standard-doped nMOS devices. These devices require no additional processing and are realizable from the basic N+ and P+ implants used to implement the standard enhancement mode MOS devices on the process. The reference is implemented as a temperature-compensated ΔVgs between anti-doped and standard-doped nMOS devices. Integrated on 0.18μm CMOS, the reference occupies less than 0.04mm2 on silicon, requires less than 500nA of quiescent current, and has a trim-free accuracy of ±1.75% which is comparable to that of the most well-behaved voltage references employing BJTs.
Keywords :
CMOS integrated circuits; MOSFET circuits; reference circuits; work function; BJTs; N+ implants; P+ implants; anti-doped N-channel MOSFETs; current 500 nA; size 0.18 mum; standard enhancement mode MOS devices; standard-doped nMOS devices; temperature-compensation; ultra low power CMOS-only voltage reference; work function; Accuracy; CMOS integrated circuits; Logic gates; MOS devices; Resistance; Silicon; Temperature measurement; Anti-Doped; CMOS Voltage Reference; Low Quiescent Current; Trim; Trim-Free; Work-Function;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2014 IEEE Proceedings of the
Conference_Location :
San Jose, CA
Type :
conf
DOI :
10.1109/CICC.2014.6946007
Filename :
6946007
Link To Document :
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