Title :
Outage Probability of Multiuser Relay Networks in Nakagami-
Fading Channels
Author :
Yang, Nan ; Elkashlan, Maged ; Yuan, Jinhong
Author_Institution :
Sch. of Inf. & Electron., Beijing Inst. of Technol., Beijing, China
fDate :
6/1/2010 12:00:00 AM
Abstract :
We evaluate the performance of downlink multiuser relay networks (MRNs) equipped with a single amplify-and-forward (AaF) relay. A thorough and exact analysis is conducted to analyze the outage probability of MRNs under dissimilar Nakagami-m fading conditions. More specifically, we derive new closed-form expressions for the outage probability and the probability density function (pdf) of the highest end-to-end signal-to-noise ratio (SNR) associated with the strongest destination with the single user and Rayleigh fading as special cases. In particular, we provide new results for channel-state information (CSI)-based-gain relaying and fixed-gain relaying. We then demonstrate that the achievable diversity order is equal to either the first-hop fading parameter or the product of the second-hop fading parameter and the number of destinations. Furthermore, we derive compact closed-form expressions for the moments of the highest end-to-end SNR, from which other moment-based measures such as the average SNR and the amount of fading are deduced. Our results highlight the performance improvements offered by opportunistic scheduling and reveal the impact of the relay location with unbalanced hops on the overall performance. Various numerical examples illustrate the proposed analysis.
Keywords :
Nakagami channels; Rayleigh channels; multi-access systems; probability; radio links; CSI-based-gain relaying; Nakagami-m fading channels; Rayleigh fading; amplify-and-forward relay; channel-state information; closed-form expressions; downlink multiuser relay networks; fixed-gain relaying; outage probability; probability density function; second-hop fading parameter; signal-to-noise ratio; Cooperative transmission; Nakagami fading; opportunistic scheduling;
Journal_Title :
Vehicular Technology, IEEE Transactions on
DOI :
10.1109/TVT.2010.2042828