DocumentCode
1418997
Title
Two-Dimensional Flex Sensor Exploiting Stacked Ultrathin Chips
Author
Endler, Stefan ; Ferwana, Saleh ; Rempp, Horst ; Harendt, Christine ; Burghartz, Joachim N.
Author_Institution
Inst. for Microelectron. Stuttgart (IMS CHIPS), Stuttgart, Germany
Volume
33
Issue
3
fYear
2012
fDate
3/1/2012 12:00:00 AM
Firstpage
444
Lastpage
446
Abstract
A new concept for mechanically flexible stress and flex sensors is presented. A stack of two ultrathin chips is exploited to compensate both thermal effects and the vertical piezoresistive effect. By tailoring the thickness of the top die, the active devices of the bottom chip become stress compensated, whereas the devices of the top chip receive maximum stress. The structural arrangement enforces that the apparent vertical stresses and the temperatures of both dies are basically identical. Thus, the differential signal of both dies provides a temperature-compensated information about the 2-D stress and flexure.
Keywords
flexible electronics; piezoresistive devices; sensors; 2D stress; apparent vertical stress; bottom chip device; maximum stress compensation; mechanically flexible stress concept; stacked ultrathin chip; structural arrangement; temperature-compensated information; thermal effect; top die thickness; two-dimensional flex sensor; vertical piezoresistive effect; MOSFETs; Piezoresistance; Silicon; Stress; Stress measurement; Temperature dependence; Temperature sensors; Flexible electronics; piezoresistive devices; stress measurement; ultrathin chips;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2011.2178389
Filename
6127900
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