• DocumentCode
    1418997
  • Title

    Two-Dimensional Flex Sensor Exploiting Stacked Ultrathin Chips

  • Author

    Endler, Stefan ; Ferwana, Saleh ; Rempp, Horst ; Harendt, Christine ; Burghartz, Joachim N.

  • Author_Institution
    Inst. for Microelectron. Stuttgart (IMS CHIPS), Stuttgart, Germany
  • Volume
    33
  • Issue
    3
  • fYear
    2012
  • fDate
    3/1/2012 12:00:00 AM
  • Firstpage
    444
  • Lastpage
    446
  • Abstract
    A new concept for mechanically flexible stress and flex sensors is presented. A stack of two ultrathin chips is exploited to compensate both thermal effects and the vertical piezoresistive effect. By tailoring the thickness of the top die, the active devices of the bottom chip become stress compensated, whereas the devices of the top chip receive maximum stress. The structural arrangement enforces that the apparent vertical stresses and the temperatures of both dies are basically identical. Thus, the differential signal of both dies provides a temperature-compensated information about the 2-D stress and flexure.
  • Keywords
    flexible electronics; piezoresistive devices; sensors; 2D stress; apparent vertical stress; bottom chip device; maximum stress compensation; mechanically flexible stress concept; stacked ultrathin chip; structural arrangement; temperature-compensated information; thermal effect; top die thickness; two-dimensional flex sensor; vertical piezoresistive effect; MOSFETs; Piezoresistance; Silicon; Stress; Stress measurement; Temperature dependence; Temperature sensors; Flexible electronics; piezoresistive devices; stress measurement; ultrathin chips;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2011.2178389
  • Filename
    6127900