DocumentCode
1419040
Title
Dual carrier suppression interferometer for measurement of phase noise
Author
Rubiola, E. ; Giordano, V.
Author_Institution
ESSTIN, Univ. Henri Poincare, Vandoeuvre Les Nanacy, France
Volume
36
Issue
25
fYear
2000
fDate
12/7/2000 12:00:00 AM
Firstpage
2073
Lastpage
2075
Abstract
A new scheme for phase noise measurement is presented, based on dual stage suppression of the carrier and synchronous detection of the noise sidebands of the device being tested. This scheme features real time output and intrinsically low instrument flicker. A prototype shows a residual flicker as low as -160 dBrad2/Hz at 1 Hz off the 100 MHz carrier. Other implementations are possible, from 1 MHz to several gigahertz. Applications include the noise characterisation of components and the design of innovative ultrastable oscillators
Keywords
UHF measurement; circuit testing; electric noise measurement; flicker noise; phase noise; radiowave interferometers; component noise characterisation; dual carrier suppression interferometer; low instrument flicker; noise sidebands; phase noise measurement; real time output; synchronous detection; ultrastable oscillator design;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:20001476
Filename
891826
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