• DocumentCode
    141914
  • Title

    Robust design and experimental demonstrations of carbon nanotube digital circuits

  • Author

    Hills, Gage ; Shulaker, Max ; Hai Wei ; Hong-Yu Chen ; Wong, H.-S Philip ; Mitra, Subhasish

  • Author_Institution
    Dept. Electr. Eng., Stanford Univ., Stanford, CA, USA
  • fYear
    2014
  • fDate
    15-17 Sept. 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Carbon nanotube field-effect transistors (CNFETs) are excellent candidates for building highly energy-efficient digital systems. However, carbon nanotubes (CNTs) are inherently highly subject to imperfections and variations that pose major obstacles to the design of robust and very-large-scale CNFET digital systems. This paper presents an overview of imperfection-immune design and robust CNT processing techniques that enabled the demonstration of the first programmable microprocessor built using CNTs. We also present an overview of a systematic methodology that selects effective combinations of CNT processing options and CNFET circuit design techniques to overcome CNT variations.
  • Keywords
    carbon nanotube field effect transistors; carbon nanotubes; integrated circuit design; CNFET circuit design techniques; CNT processing options; CNT processing techniques; CNT variations; carbon nanotube digital circuits; carbon nanotube field-effect transistors; imperfection-immune design; programmable microprocessor; very-large-scale CNFET digital systems; CNTFETs; Delays; Digital systems; Electric breakdown; Fabrication; Layout; Substrates; Carbon Nanotube Imperfections; Carbon Nanotube Variations; Carbon Nanotubes; Delay Variations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference (CICC), 2014 IEEE Proceedings of the
  • Conference_Location
    San Jose, CA
  • Type

    conf

  • DOI
    10.1109/CICC.2014.6946036
  • Filename
    6946036