DocumentCode
141914
Title
Robust design and experimental demonstrations of carbon nanotube digital circuits
Author
Hills, Gage ; Shulaker, Max ; Hai Wei ; Hong-Yu Chen ; Wong, H.-S Philip ; Mitra, Subhasish
Author_Institution
Dept. Electr. Eng., Stanford Univ., Stanford, CA, USA
fYear
2014
fDate
15-17 Sept. 2014
Firstpage
1
Lastpage
4
Abstract
Carbon nanotube field-effect transistors (CNFETs) are excellent candidates for building highly energy-efficient digital systems. However, carbon nanotubes (CNTs) are inherently highly subject to imperfections and variations that pose major obstacles to the design of robust and very-large-scale CNFET digital systems. This paper presents an overview of imperfection-immune design and robust CNT processing techniques that enabled the demonstration of the first programmable microprocessor built using CNTs. We also present an overview of a systematic methodology that selects effective combinations of CNT processing options and CNFET circuit design techniques to overcome CNT variations.
Keywords
carbon nanotube field effect transistors; carbon nanotubes; integrated circuit design; CNFET circuit design techniques; CNT processing options; CNT processing techniques; CNT variations; carbon nanotube digital circuits; carbon nanotube field-effect transistors; imperfection-immune design; programmable microprocessor; very-large-scale CNFET digital systems; CNTFETs; Delays; Digital systems; Electric breakdown; Fabrication; Layout; Substrates; Carbon Nanotube Imperfections; Carbon Nanotube Variations; Carbon Nanotubes; Delay Variations;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference (CICC), 2014 IEEE Proceedings of the
Conference_Location
San Jose, CA
Type
conf
DOI
10.1109/CICC.2014.6946036
Filename
6946036
Link To Document