Two-port noise and impedance measurements for two-terminal devices with a resonant tunneling diode example

Author

Przadka, Andreas ; Webb, Kevin J. ; Janes, David B.

Author_Institution

Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA

Volume

46

Issue

9

fYear

1998

fDate

9/1/1998 12:00:00 AM

Firstpage

1215

Lastpage

1220

Abstract

A two-port technique is presented for determining the circuit elements and noise sources of the equivalent circuit of a two-terminal device at microwave frequencies. The two-terminal device is connected as a two-port so that intrinsic and parasitic circuit elements can be obtained from full two-port S-parameter measurements. This measurement does not require one of the two contacts to be grounded, which makes it particularly well suited for the characterization of integrated devices where parasitic elements become important and cannot be easily calculated. The noise of the device is measured by employing a noise-figure meter and the intrinsic noise is computed from the measured terminal noise. As an example, the impedance and noise elements of a resonant tunneling diode (RTD) are measured over frequency ranges of 2-8 and 2-4 GHz, respectively

Keywords

S-parameters; electric impedance measurement; electric noise measurement; equivalent circuits; microwave diodes; resonant tunnelling diodes; semiconductor device noise; 2 to 4 GHz; 2 to 8 GHz; S-parameter measurements; equivalent circuit; impedance measurements; intrinsic circuit elements; microwave frequencies; noise-figure meter; parasitic circuit elements; parasitic elements; resonant tunneling diode; terminal noise; two-port noise; two-terminal devices; Circuit noise; Equivalent circuits; Impedance measurement; Integrated circuit measurements; Microwave circuits; Microwave frequencies; Noise measurement; Particle measurements; Resonant tunneling devices; Scattering parameters;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.709459

Filename

709459