DocumentCode :
1419272
Title :
Location of Wire Faults Using Chaotic Signal
Author :
Wang, Anbang ; Zhang, Mingjiang ; Xu, Hang ; Wang, Yuncai
Author_Institution :
Dept. of Phys. & Optoelectron., Taiyuan Univ. of Technol., Taiyuan, China
Volume :
32
Issue :
3
fYear :
2011
fDate :
3/1/2011 12:00:00 AM
Firstpage :
372
Lastpage :
374
Abstract :
We propose a method for testing wire fault using a chaotic signal. The fault is detected by correlating the chaotic signal back-reflected from the fault with its delayed duplicate. Centimeter-level spatial resolution and antijamming can be achieved, benefiting from the broadband and randomness of the chaotic waveform. We experimentally proved that our method can be used to locate the impedance discontinuities of several different kinds of electric cables. Preliminary experiments obtained 0.5-m resolution with a data acquisition bandwidth of 120 MHz. Further, we demonstrate the ability for testing live wires using our method.
Keywords :
cables (electric); chaos; circuit testing; electric impedance; fault location; wires (electric); antijamming; bandwidth 120 MHz; centimeter-level spatial resolution; chaotic signal; chaotic waveform; data acquisition bandwidth; delayed duplicate; electric cable; fault detection; impedance discontinuity; wire fault location; wire fault testing; Chaos; fault location; semiconductor lasers; time domain reflectometry (TDR);
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2010.2097237
Filename :
5680939
Link To Document :
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