DocumentCode :
141932
Title :
Conductance modulation techniques in switched-capacitor DC-DC converter for maximum-efficiency tracking and ripple mitigation in 22nm Tri-gate CMOS
Author :
Jain, R. ; Kim, Sungho ; Vaidya, Vivek ; Tschanz, James ; Ravichandran, Krishnan ; De, Vivek
Author_Institution :
Circuit Res. Lab., Intel Corp., Hillsboro, OR, USA
fYear :
2014
fDate :
15-17 Sept. 2014
Firstpage :
1
Lastpage :
4
Abstract :
Active conduction modulation techniques are demonstrated in a fully integrated multi-ratio switched-capacitor voltage regulator with hysteretic control, implemented in 22nm tri-gate CMOS with high-density MIM capacitor. We present (i) an adaptive switching frequency and switch-size scaling scheme for maximum efficiency tracking across a wide range voltages and currents, governed by a frequency-based control law that is experimentally validated across multiple dies and temperatures, and (ii) a simple active ripple mitigation technique to modulate gate drive of select MOSFET switches effectively in all conversion modes. Efficiency boosts upto 15% at light loads are measured under light load conditions. Load-independent output ripple of <;50mV is achieved, enabling fewer interleaving. Testchip implementations and measurements demonstrate ease of integration in SoC designs, power efficiency benefits and EMI/RFI improvements.
Keywords :
CMOS digital integrated circuits; DC-DC power convertors; MOSFET; electromagnetic interference; radiofrequency interference; switched capacitor networks; system-on-chip; EMI improvements; MOSFET switches; RFI improvements; SoC designs; active conduction modulation techniques; active ripple mitigation technique; adaptive switching frequency; conversion modes; dc-dc converter; frequency-based control law; fully integrated multiratio switched-capacitor voltage regulator; gate drive; high-density MIM capacitor; hysteretic control; light load conditions; maximum-efficiency tracking; power efficiency benefits; size 22 nm; switch-size scaling scheme; systems-on-chips; testchip implementations; trigate CMOS; Control systems; Current measurement; Logic gates; Modulation; Switching frequency; Temperature measurement; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2014 IEEE Proceedings of the
Conference_Location :
San Jose, CA
Type :
conf
DOI :
10.1109/CICC.2014.6946052
Filename :
6946052
Link To Document :
بازگشت