Title :
Wide-band 2N-port S-parameter extraction from N-port data
Author_Institution :
Motorola Inc., Austin, TX, USA
fDate :
9/1/1998 12:00:00 AM
Abstract :
A technique is presented for extracting the full 2N×2N set of S-parameters for an N-conductor interconnect from five sets of N-port S-parameter measurements on three specially prepared samples. Bandwidth is improved over prior techniques using two samples. Experiments confirm the bandwidth enhancement and illustrate the operational mechanism and accuracy expectations
Keywords :
S-matrix theory; S-parameters; digital circuits; integrated circuit interconnections; multiport networks; packaging; N-conductor interconnect; N-port S-parameter measurements; N-port data; bandwidth enhancement; lumped model; package characterisation; wideband 2N-port S-parameter extraction; Bandwidth; Data mining; Equations; Frequency measurement; Impedance measurement; Jacobian matrices; Scattering parameters; Wideband;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
