DocumentCode
141957
Title
High linearity PVT tolerant 100MS/s rail-to-rail ADC driver with built-in sampler in 65nm CMOS
Author
Palani, Rakesh Kumar ; Harjani, Ramesh
Author_Institution
Univ. of Minnesota, Minneapolis, MN, USA
fYear
2014
fDate
15-17 Sept. 2014
Firstpage
1
Lastpage
4
Abstract
A novel completely inverter-based ADC driver is proposed that relaxes the gain and unity gain bandwidth requirements of the negative feedback loop by making it not see the closed loop gain. This ADC driver has a built-in first order anti alias filter and uses a passive amplifier to provide a rail-to-rail sampled output signal. This design exploits the linearity of current mirrors and achieves 65dB of linearity at the Nyquist rate for a rail-to-rail output. A semi-constant current biasing circuit for inverters has been proposed to minimizing PVT variations in lower technologies. As a proof of concept an ADC driver is designed and implemented in TSMC´s 65nm GP CMOS technology. The measured design operates at 100MS/s and has an OIP3 of 40dBm at the Nyquist rate, provides a gain of 8, and samples the signal onto a 1pF output capacitance while drawing 2mA from a 1V supply.
Keywords
analogue-digital conversion; current mirrors; driver circuits; feedback; Nyquist rate; anti alias filter; built in sampler; closed loop gain; current 2 mA; current mirrors; high linearity PVT tolerant rail to rail ADC driver; negative feedback loop; passive amplifier; semiconstant current biasing circuit; size 65 nm; unity gain bandwidth; voltage 1 V; Bandwidth; Capacitors; Frequency measurement; Inverters; Linearity; Noise; Resistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference (CICC), 2014 IEEE Proceedings of the
Conference_Location
San Jose, CA
Type
conf
DOI
10.1109/CICC.2014.6946065
Filename
6946065
Link To Document