DocumentCode :
1419632
Title :
COCA: a novel 3-D FE simulator for the design of TWT´s multistage collectors
Author :
Coco, Salvatore ; Emma, Francesco ; Laudani, Antonio ; Pulvirenti, Sabrina ; Sergi, Mirko
Author_Institution :
Ist. di Elettro, Elettronica e Sistemistico, Catania Univ., Italy
Volume :
48
Issue :
1
fYear :
2001
fDate :
1/1/2001 12:00:00 AM
Firstpage :
24
Lastpage :
31
Abstract :
In this paper, the simulator COCA, a novel fully three-dimensional (3-D) finite-element (FE) tool for the design of multistage depressed TWTs collectors is illustrated. COCA has been developed at the University of Catania under an ESA/ESTEC project. The complete simulator consists of three main modules: a fully 3-D deterministic/neural FE mesh generator, an FE Vlasov solver coupled with an electron trajectory tracer taking into account also external magnetic fields, and a postprocessing module for result restitution, including secondary electron emission effects. All the functions are interactively managed and executed by means of an especially developed user-friendly graphical user interface which controls all the various aspects of a simulation session. The results of a simulation test performed on an asymmetric collector are also reported showing excellent agreement with available measured data. The COCA simulator provides the user with flexible and effective tools to design, test, optimize, and verify innovative asymmetrical geometries for TWT collectors
Keywords :
digital simulation; electronic design automation; finite element analysis; magnetic fields; secondary electron emission; travelling wave tubes; 3D FE simulator; COCA; TWT; Vlasov solver; asymmetric collector; deterministic/neural FE mesh generator; electron trajectory tracer; external magnetic fields; multistage collectors; postprocessing module; secondary electron emission effects; simulation test; user-friendly graphical user interface; Couplings; Design optimization; Electron emission; Finite element methods; Graphical user interfaces; Iron; Mesh generation; Performance evaluation; Solid modeling; Testing;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.892163
Filename :
892163
Link To Document :
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